Testronics Profiling System :
The Testronics system does not have the disadvantages of the X-Ray systems. This is because no images are taken and no AOI
algorithms are used. Instead, the Testronics system uses a non-contact line scanner to create a 3 dimensional map (profile) of the
backplane, connectorpins and connector holes. The height of each connector pin as well as its depth into the hole is mapped (profiled).
Because the Testronics system measures the actual height and depth of each pin, defects can be detected quickly and repeatably.